institute of electrical and electronics engineers (18)
ieee computer society (11)
international test conference (9)
ieee international automatic testing conference (6)
sponsored by the institute of electrical and electronics engineers [and others] (6)
sponsored by the ieee computer society, test technology technical committee and ieee philadelphia section (5)
ieee electron devices society (2)
ieee international conference on microelectronic test structures (2)
sponsored by the ieee computer society, ieee philadelphia section (2)
1980 [eleventh] test conference, november 11, 12, 13, 1980, [philadelphia] ; sponsored by ieee computer society, test technology committee, philadelphia section of the ieee (1)
[sponsored by the ieee computer society test technology technical committee and ieee philadelphia section] (1)
a symposium sponsored by astm subcommittee f01.02 on lasers of committee f-1 on electronics, american society for testing and materials, ft. lauderdale, fla., 11 jan. 1978, a.h. guenther, air force weapons laboratory, and d.h. liebenberg, los alamos scientific laboratory, editors (1)
american society for quality control (1)
guenther, arthur henry, (1)
institute of environmental sciences (1)
institution of electrical engineers (1)
liebenberg, d. h., (1)
society for non-destructive testing (1)
sponsored by electronics test, circuits manufacturing (1)
sponsored by ieee computer society, test technology committee and the philadelphia section of the ieee (1)
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	1.		ATE and Instrumentation conference West : Proceedings : Get Ready for the Next Dacade of Test / 订购中著者: Sponsored by Electronics Test Circuits Manufacturing 出版社: Miller Freeman Expo., 出版日期: c1990 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	2.		ICMTS 1994 : proceedings of the 1995 International Conference on Microelectronic Test Structures : March 22-25, 1994, San Diego, California / 订购中著者: sponsored by the IEEE Electron Devices Society. 出版社: IEEE Service Center, 出版日期: c1994. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	3.		Proceedings International Test Conference 1992 : [September 20-24, 1992, Convention Center, Baltimore, MD, USA] / 订购中著者: [sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section] 出版社: The Conference ; 出版日期: c1992. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	4.		Proceedings : International Test Conference 1991, October 26-30, 1991, Opryland Hotel, Nashville, TN / 订购中著者: sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section. 出版社: International Test Conference, 出版日期: c1991. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	5.		Proceedings : International Test Conference 1990, October 26-30, 1990, Sheraton Washington Hotel, Washington D. C. / 订购中著者: sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section. 出版社: International Test Conference, 出版日期: c1990. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	6.		Proceedings : International Test Conference 1985, October 28-31, 1989, Sheraton Washington Hotel, Washington D. C. / 订购中著者: sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section. 出版社: International Test Conference, 出版日期: c1989. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	7.		Proceedings : International Test Conference 1988, October 27-30 1988, Sheraton Washington Hotel, Washington D. C. / 订购中著者: sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section. 出版社: International Test Conference, 出版日期: c1988. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	8.		Proceedings : International Test Conference 1985, October 28-31, 1985, Sheraton Washington Hotel, Washington D. C. / 订购中著者: sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section. 出版社: International Test Conference, 出版日期: c1985. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	9.		The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 / 订购中著者: sponsored by the IEEE Computer Society Test Technology Committee IEEE Philadelphia Section. 出版社: IEEE Computer Society Press, 出版日期: c1984. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	10.		AUTOTESTCON 91 : proceedings ... / 订购中著者: sponsored by the Institute of Electrical and Electronics Engineers [and others]. 出版社: IEEE, 出版日期: 1991. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介