q=Society+of+Electron-Microscopy%2C+Japan%2C&searchType=standard&isFacet=true&view=standard&searchWay=publisher&rows=10&sortWay=score&sortOrder=desc&searchWay0=marc&logical0=AND
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Society of Electron-Microscopy, Japan,
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denshi kenbikyō gakkai (japan)
(1)
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edited by g. shinoda, k. kohra and t. ichinokawa
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edited by g.k. krieglstein, w. leydhecker
(1)
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ichinokawa, takeo,
(1)
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international congress on x-ray optics and microanalysis
(1)
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kohra, kazutake,
(1)
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krieglstein, g. k
(1)
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leydhecker, w
(1)
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nihon denshi kenbikyō gakkai
(1)
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nihon gakujutsu kaigi
(1)
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ōyō butsuri gakkai
(1)
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shinoda, gunji,
(1)
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