ieee electron devices society (46)
ieee microwave theory and techniques society (16)
institute of electrical and electronics engineers (13)
united states (12)
gaas ic symposium (ieee gallium arsenide integrated circuit symposium) ; sponsored by the ieee electron devices society, and cooperatively sponsored by the ieee microwave theory and techniques society (10)
ieee gallium arsenide integrated circuit symposium (10)
international reliability physics symposium (8)
electronics technology and devices laboratory (u.s.) (7)
ieee reliability society (7)
ieee ultrasonics, ferroelectrics, and frequency control society (7)
sponsored by the ieee electron devices society and the ieee reliability society (7)
co-sponsored by the u.s.army electronic technology and devices laboratory (6)
electronic components laboratory (u.s.) (6)
electronic industries association (6)
ieee microwave and millimeter-wave monolithic circuits symposium (6)
society for information display (6)
symposium on frequency control (6)
u.s. army electronics research and development laboratory (6)
u.s. army signal engineering laboratories (6)
custom integrated circuits conference (5)
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	1.		ICMTS 1994 : proceedings of the 1995 International Conference on Microelectronic Test Structures : March 22-25, 1994, San Diego, California / 订购中著者: sponsored by the IEEE Electron Devices Society. 出版社: IEEE Service Center, 出版日期: c1994. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	2.		Reliability physics 1991 : 29th annual proceedings, Las Vegas, Nevadaa, April 9, 10, 11, 1991 / 订购中著者: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society. 出版社: Electron Device[s] Society and Reliability Society of the Institute of Electrical and Electronics Engineers, 出版日期: c1991. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	3.		Reliability physics 1990 : 28th annual proceedings, New Orleans, Louisiana, March 27, 28, 29, 1990 / 订购中著者: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society. 出版社: Institute of Electrical and Electronics Engineers, 出版日期: c1990. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	4.		Reliability physics 1989 : 27th annual proceedings, Phoenix, Arizona, April 11, 12, 13, 1989 / 订购中著者: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society. 出版社: Institute of Electrical and Electronics Engineers, 出版日期: c1989. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	5.		Reliability physics 1988 : 26th annual proceedings, Monterey, California, April 12, 13, 14, 1988 / 订购中著者: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society. 出版社: Electron Device[s] and Reliability Societies of the Institute of Electrical and Electronics Engineers, 出版日期: c1988. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	6.		Reliability physics 1987 : 25th annual proceedings, San Diego, California, April 7, 8, 9, 1987 / 订购中著者: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society. 出版社: Electron Device[s] and Reliability Societies of the Institute of Electrical and Electronics Engineers, 出版日期: c1987. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	7.		Reliability physics 1980 : 18th annual proceedings, Las Vegas, Nevada, April 8-10, 1980 / 订购中著者: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society. 出版社: Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, 出版日期: ©1980. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	8.		Reliability physics 1979 : 17th annual proceedings, San Francisco, California, April 24-26, 1979 / 订购中著者: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society. 出版社: The Society, 出版日期: ©1979. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	9.		1992 Symposium on VLSI Technology : digest of technical papers, June 2-4, 1992, Seattle / 订购中著者: [sponsored by] the IEEE Electron Devices Society the Japan Society of Applied Physics. 出版社: J.H. Wourinen ; 出版日期: c1992. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介
	10.		ICMTS 1989 : proceedings of the 1989 International Conference on Microelectronic Test Structures, Edinburgh, Scotland, 13-14th March 1989 / 订购中著者: sponsored by the IEEE Electron Devices Society in cooperation with the IEE. 出版社: IEEE, 出版日期: c1989. 文献类型: 图书 , 索书号: 在馆信息电子资源随书附盘图书信息概览图书目录试读信息内容简介著者简介